A Fault Coverage Evaluation of Linked Neighborhood Pattern-Sensitive Faults in Random-Access Memories
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چکیده
A fault coverage evaluation concerning a linked neighborhood pattern sensitive faults model (NPSFs) in N × 1 random-access memories is presented. For the simulation study, the most important published tests dedicated to the NPSF model have been considered. Simulation results show that these tests cover the entire model of simple NPSFs, but only the longer of them cover the linked NPSF model. In addition, a fault coverage evaluation of linked faults involving a single cell (LF1s), two cells (LF2s), and three cells (LF3s) is also presented.
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تاریخ انتشار 2010